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Proceedings Paper

Magnetic x-ray measurements using the elliptical multipole wiggler
Author(s): Pedro A. Montano; Yinwan Li; Uta Ruett; Mark A. Beno; Guy Jennings; Clyde W. Kimball
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Paper Abstract

The EMW at the BESSRC beam lines at the APS provides high photon flux at high energies with the capability of producing circular polarization on axis. We observe a high degree of circularly polarized x-rays at such energies. The polarization and frequency tunability of the elliptical multipole wiggler (EMW) is an ideal source for many magnetic measurements from X-ray Magnetic Circular Dichroism (XMCD) to Compton scattering experiments. We performed Compton scattering measurements to determine the polarization and photon flux at the sample as a function of the deflection parameters Ky and Kx. We used for our measurements a Si (220) Laue monochromator providing simultaneous photon energies at 50 keV, 100 keV and 150 keV. Magnetic Compton Profiles were determined by either switching the magnet polarity or the photon helicity. The results obtained using Fe(110) single crystals were very similar.

Paper Details

Date Published: 16 November 1999
PDF: 13 pages
Proc. SPIE 3773, X-Ray Optics Design, Performance, and Applications, (16 November 1999); doi: 10.1117/12.370099
Show Author Affiliations
Pedro A. Montano, Argonne National Lab. and Univ. of Illinois/Chicago (United States)
Yinwan Li, Argonne National Lab. and Univ. of Illinois/Chicago (United States)
Uta Ruett, Argonne National Lab. and Northern Illinois Univ. (United States)
Mark A. Beno, Argonne National Lab. (United States)
Guy Jennings, Argonne National Lab. (United States)
Clyde W. Kimball, Argonne National Lab. and Northern Illinois Univ. (United States)


Published in SPIE Proceedings Vol. 3773:
X-Ray Optics Design, Performance, and Applications
Ali M. Khounsary; Andreas K. Freund; Tetsuya Ishikawa; George Srajer; Jonathan C. Lang, Editor(s)

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