Share Email Print
cover

Proceedings Paper

First polarization measurements of OPHELIE: a versatile polarization VUV undulator at Super-ACO
Author(s): Christian Alcaraz; Roland Thissen; M. Compin; Antoine Jolly; Markus Drecher; Laurent Nahon
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper reports on the first characterization of the polarization generated by the crossed overlapped electromagnetic undulator, OPHELIE, of the new high flux/high resolution VUV beamline, SU5, in the Super-ACO storage ring at LURE. The beamline configuration for these tests was reduced after the undulator to a single mirror M1, a TGM monochromator and a multiple-reflection polarimeter. The versatility of polarizations generated by the undulator has been demonstrated around 7 eV by the measurements after the monochromator of highly polarized light either linearly (Ptot greater than 95%) or circularly (Ptot up to 80%). The standard mode of operation which produces a strong vertical linear polarization as well as the other exotic modes like the horizontal and the tilted linear polarizations, the left- and right-handed polarization and the switching between these modes, have been validated for a very large range of photon energies across the undulator spectrum.

Paper Details

Date Published: 16 November 1999
PDF: 12 pages
Proc. SPIE 3773, X-Ray Optics Design, Performance, and Applications, (16 November 1999); doi: 10.1117/12.370097
Show Author Affiliations
Christian Alcaraz, Univ. de Paris-Sud (France)
Roland Thissen, Univ. de Paris-Sud (France)
M. Compin, Univ. de Paris-Sud (France)
Antoine Jolly, Univ. Bielefeld (Germany)
Markus Drecher, Univ. Bielefeld (Germany)
Laurent Nahon, Univ. de Paris-Sud and CEA-Saclay (France)


Published in SPIE Proceedings Vol. 3773:
X-Ray Optics Design, Performance, and Applications
Ali M. Khounsary; Andreas K. Freund; Tetsuya Ishikawa; George Srajer; Jonathan C. Lang, Editor(s)

© SPIE. Terms of Use
Back to Top