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Proceedings Paper

Quantitive magnetic domain correlation by x-ray resonant magnetic scattering
Author(s): Yves U. Idzerda; John William Freeland
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Paper Abstract

By using X-ray resonant magnetic scattering, the correlation of magnetic domains taken vertically in a Co/Cr/Co magnetic trilayer can be statistically quantified as a function of applied magnetic field. From these scans and from element specific magnetic hysteresis loops, we can identify the presence of both interlayer anti-ferromagnetic exchange coupling and ferromagnetic dipolar coupling within the trilayer.

Paper Details

Date Published: 16 November 1999
PDF: 12 pages
Proc. SPIE 3773, X-Ray Optics Design, Performance, and Applications, (16 November 1999); doi: 10.1117/12.370096
Show Author Affiliations
Yves U. Idzerda, Naval Research Lab. (United States)
John William Freeland, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 3773:
X-Ray Optics Design, Performance, and Applications
Ali M. Khounsary; Andreas K. Freund; Tetsuya Ishikawa; George Srajer; Jonathan C. Lang, Editor(s)

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