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Proceedings Paper

Characteristics of the thin crystal spectrometer
Author(s): Shunji Kitamoto; Hideki Ogata; Takako Horikawa
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Paper Abstract

We report the characteristics of 'the thin crystal spectrometer,' which is a new technique for a x-ray spectrometer using a thin crystal. The reflection by a thin crystal in the 'Laue' geometry has a diffraction pattern with a finite width. The reflection angle does not need to be the same to the incident angle. The crystal structure along to the crystal plane makes the interference of the reflected x rays and the reflection angle becomes a function of an x-ray wave length. Therefore, the expected energy resolution of this type of the spectrometer is comparable with a usual Bragg crystal, whereas this new spectrometer can have a certain energy band. We report a simple experiment demonstrating this idea, where we show the energy resolution of (E/(Delta) E greater than 2000) and the energy band of ((Delta) E greater than 6 eV). The applications for a focusing optics are briefly presented.

Paper Details

Date Published: 16 November 1999
PDF: 8 pages
Proc. SPIE 3773, X-Ray Optics Design, Performance, and Applications, (16 November 1999); doi: 10.1117/12.370092
Show Author Affiliations
Shunji Kitamoto, Osaka Univ. and Japan Science and Technology Corp. (Japan)
Hideki Ogata, Osaka Univ. (Japan)
Takako Horikawa, Osaka Univ. (Japan)


Published in SPIE Proceedings Vol. 3773:
X-Ray Optics Design, Performance, and Applications
Ali M. Khounsary; Andreas K. Freund; Tetsuya Ishikawa; George Srajer; Jonathan C. Lang, Editor(s)

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