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Proceedings Paper

Laterally graded multilayer double-monochromator
Author(s): Albert T. Macrander; Jens Als-Nielsen; Chian Liu; S. Felix Krasnicki; Jozef Maj; Derrick C. Mancini; Jenny Erdmann; P. Gaarde
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Paper Abstract

We describe a tunable multilayer monochromator with an adjustable bandpass to be used for reflectivity and grazing incidence diffraction studies on surfaces at energies near 10 keV. Multilayers have a bandpass typically 100 times larger than the Si(111) reflection, and by using multilayers an experimenter can significantly increase data collection rates over those available with a Si monochromator. The transmission through 1 and 2 laterally graded multilayer (LGML) reflections was recorded versus photon energy. The identical LGMLs were comprised of 60 bilayers of W and C on 100 X 25 X 3 mm float glass with a bilayer spacing varying from 35 to 60 angstrom. The average gradient was 0.27 angstrom/mm along the long dimension. The rms deviation of the data for the bilayer spacing from a linear fit was 0.36 angstrom. Data were obtained for a nondispersive (plus or minus) double-multilayer arrangement. The relative bandpass width (FWHM) when the two multilayers exposed the same bilayer spacing was measured to be 2.2% with a transmission of 78.7 plus or minus 1.6%. This value is consistent with the transmission of 88.9% that we also measured for a single LGML at HASYLAB beamline D4. The bandpass was tunable in the range 1.1% to 2.2%.

Paper Details

Date Published: 16 November 1999
PDF: 7 pages
Proc. SPIE 3773, X-Ray Optics Design, Performance, and Applications, (16 November 1999); doi: 10.1117/12.370084
Show Author Affiliations
Albert T. Macrander, Argonne National Lab. (United States)
Jens Als-Nielsen, Copenhagen Univ. (Denmark)
Chian Liu, Argonne National Lab. (United States)
S. Felix Krasnicki, Argonne National Lab. (United States)
Jozef Maj, Argonne National Lab. (United States)
Derrick C. Mancini, Argonne National Lab. (United States)
Jenny Erdmann, Argonne National Lab. (United States)
P. Gaarde, Copenhagen Univ. (Denmark)

Published in SPIE Proceedings Vol. 3773:
X-Ray Optics Design, Performance, and Applications
Ali M. Khounsary; Andreas K. Freund; Tetsuya Ishikawa; George Srajer; Jonathan C. Lang, Editor(s)

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