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Proceedings Paper

Nonintrusive surface inspection utilizing infrared light radiation
Author(s): Hatim Abdul Hamid; Wojtek Wlodarski; Frank Brennan
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Paper Abstract

The need for quality control has lead to the implementation of automatic surface inspection systems, which have improved on-line monitoring of surface quality. Enamelled copper wire, cable and optical fiber are three examples where surface quality is very important. An extensive literature review conducted by the authors, has shown that with the current state of technology, there is much room for improvement in the field of non-destructive defect detection for enamelled copper wire. In this paper, the authors describe an IR light based surface inspection system which has been developed for non-destructive defect detection on cables, optical fiber and specifically on enamelled copper wire. Finally, results from extensive trials at an enamelled copper wire manufacturing company are presented and compared to a simulation, of the defect detection head.

Paper Details

Date Published: 11 November 1999
PDF: 8 pages
Proc. SPIE 3897, Advanced Photonic Sensors and Applications, (11 November 1999); doi: 10.1117/12.369370
Show Author Affiliations
Hatim Abdul Hamid, Royal Melbourne Institute of Technology (Australia)
Wojtek Wlodarski, Royal Melbourne Institute of Technology (Australia)
Frank Brennan, Royal Melbourne Institute of Technology (Australia)

Published in SPIE Proceedings Vol. 3897:
Advanced Photonic Sensors and Applications
Robert A. Lieberman; Anand Krishna Asundi; Hiroshi Asanuma, Editor(s)

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