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Proceedings Paper

High-precision measurement scheme for half-wave voltage of Y-tap MIOC
Author(s): Yuanhong Yang; Weixu Zhang; Jing Ma
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Paper Abstract

A high-precision measure scheme for half-wave voltage V(pi ) of Y-tap MIOC is proposed. This scheme is based on Sagnac interferometer and a saw-tooth wave with special period is used. With this scheme, the temperature characteristics of V(pi ) of a type of MIOC is studied experimentally. The result shows that its half-wave voltage is temperature-dependent. In the range of -10 to +55, the varying value is 0.162V, the temperature coefficient is 662 PPM/degrees C and the variation is linear and repetitive. Experimental study and detail discussion demonstrate that high accuracy can be achieved with this scheme and it is very suitable to be used in studying and calibrating V(pi ) of the modulator used in close-loop FOG in-site.

Paper Details

Date Published: 11 November 1999
PDF: 5 pages
Proc. SPIE 3897, Advanced Photonic Sensors and Applications, (11 November 1999); doi: 10.1117/12.369337
Show Author Affiliations
Yuanhong Yang, Beijing Univ. of Aeronautics and Astronautics (China)
Weixu Zhang, Beijing Univ. of Aeronautics and Astronautics (China)
Jing Ma, Beijing Univ. of Aeronautics and Astronautics (China)


Published in SPIE Proceedings Vol. 3897:
Advanced Photonic Sensors and Applications
Robert A. Lieberman; Anand Krishna Asundi; Hiroshi Asanuma, Editor(s)

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