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Proceedings Paper

Alignment and diagnostics of the National Ignition Facility laser system
Author(s): Robert D. Boyd; Erlan S. Bliss; Steven J. Boege; Robert D. Demaret; Mark Feldman; Alan J. Gates; Fred R. Holdener; J. Hollis; Carl F. Knopp; Tom J. McCarville; Victoria J. Miller-Kamm; W. E. Rivera; J. Thaddeus Salmon; J. R. Severyn; Calvin E. Thompson; David Yu-Hsi Wang; Richard A. Zacharias
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Paper Abstract

The NIF laser system will be capable of delivering 1.8 MJ of 351 nm energy in 192 beams. Diagnostics instruments must measure beam energy, power vs. time, wavefront quality, and beam intensity proifle to characterize laser performance. Alignment and beam diagnostics are also used to set the laser up for the high power shots and to isolate problems when performance is less than expected. Alignment and beam diagnostics are multiplexed to keep the costs under control. At the front-end the beam is aligned and diagnosed in an input sensor package. The output 1053 nm beam is sampled by collecting a 0.1% reflection from an output beam sampler and directing it to the output sensor package (OSP). The OSP also gets samples from final focus lens reflection and samples from the transport spatial filter pinhole plane. The output 351 nm energy is measured by a calorimeter collecting the signal from an off-axis diffractive beam-sampler. Detailed information on the focused beam in the high-energy target focal plane region is gathered in the precision diagnostics. This paper describes the design of the alignment and diagnostics on the NIF laser system.

Paper Details

Date Published: 11 November 1999
PDF: 6 pages
Proc. SPIE 3782, Optical Manufacturing and Testing III, (11 November 1999); doi: 10.1117/12.369229
Show Author Affiliations
Robert D. Boyd, Lawrence Livermore National Lab. (United States)
Erlan S. Bliss, Lawrence Livermore National Lab. (United States)
Steven J. Boege, Lawrence Livermore National Lab. (United States)
Robert D. Demaret, Lawrence Livermore National Lab. (United States)
Mark Feldman, Lawrence Livermore National Lab. (United States)
Alan J. Gates, Lawrence Livermore National Lab. (United States)
Fred R. Holdener, Lawrence Livermore National Lab. (United States)
J. Hollis, Lawrence Livermore National Lab. (United States)
Carl F. Knopp, Lawrence Livermore National Lab. (United States)
Tom J. McCarville, Lawrence Livermore National Lab. (United States)
Victoria J. Miller-Kamm, Lawrence Livermore National Lab. (United States)
W. E. Rivera, Lawrence Livermore National Lab. (United States)
J. Thaddeus Salmon, Lawrence Livermore National Lab. (United States)
J. R. Severyn, Lawrence Livermore National Lab. (United States)
Calvin E. Thompson, Lawrence Livermore National Lab. (United States)
David Yu-Hsi Wang, Lawrence Livermore National Lab. (United States)
Richard A. Zacharias, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 3782:
Optical Manufacturing and Testing III
H. Philip Stahl, Editor(s)

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