Share Email Print

Proceedings Paper

Simplified spectral imaging using a pair of CCD's with filters for shape measurement
Author(s): Xiaoli L. Dai; Kaoru Minoshima; Katuo Seta
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

For real-time 3D imaging using chirped optical pulses and a femtosecond optical Kerr shutter to measure the shape accurately, we need to develop a spectral imaging method which has a high-resolution in both space and spectrum. The spectral property of the light which is generated from the chirped pulse by the femtosecond optical Kerr shutter, the wavelength is measured as the line spectrum. Therefore, the wavelength can be determined by two detectors with different spectral properties. To obtain the line spectral image, we proposed a pair of filters, the transmissivities of which vary monotonously with the wavelength, one increases with the wavelength, the other decreases. Since the ratio between the transmissivities of the two filters changes monotonously for wavelength range of 550 - 750 nm, the wavelength of line spectrum is determined uniquely for the range with a simple function of the ratio. These filters were set in front of two monochromatic CCDs which are aligned to take an image. The resolution to determine the wavelength is tested with a monochrometer and the standard deviation for each pixel is estimated to be about 10 nm. Compared the methods of color CCD and spectrometer, this method of pair-CCDs has high spatial resolution, uniform spectral resolution, wide spectral measurement range, and simple setup.

Paper Details

Date Published: 11 November 1999
PDF: 8 pages
Proc. SPIE 3782, Optical Manufacturing and Testing III, (11 November 1999); doi: 10.1117/12.369199
Show Author Affiliations
Xiaoli L. Dai, National Research Lab. of Metrology (Canada)
Kaoru Minoshima, National Research Lab. of Metrology (Japan)
Katuo Seta, National Research Lab. of Metrology (Japan)

Published in SPIE Proceedings Vol. 3782:
Optical Manufacturing and Testing III
H. Philip Stahl, Editor(s)

© SPIE. Terms of Use
Back to Top