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Proceedings Paper

Nondimensional parameter for conformal grinding: combining machine and process parameters
Author(s): Paul D. Funkenbusch; Toshio Takahashi; Sheryl M. Gracewski; Jeffrey L. Ruckman
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Paper Abstract

Conformal grinding of optical materials with CNC (Computer Numerical Control) machining equipment can be used to achieve precise control over complex part configurations. However complications can arise due to the need to fabricate complex geometrical shapes at reasonable production rates. For example high machine stiffness is essential, but the need to grind 'inside' small or highly concave surfaces may require use of tooling with less than ideal stiffness characteristics. If grinding generates loads sufficient for significant tool deflection, the programmed removal depth will not be achieved. Moreover since grinding load is a function of the volumetric removal rate the amount of load deflection can vary with location on the part, potentially producing complex figure errors. In addition to machine/tool stiffness and removal rate, load generation is a function of the process parameters. For example by reducing the feed rate of the tool into the part, both the load and resultant deflection/removal error can be decreased. However this must be balanced against the need for part through put. In this paper a simple model which permits combination of machine stiffness and process parameters into a single non-dimensional parameter is adapted for a conformal grinding geometry. Errors in removal can be minimized by maintaining this parameter above a critical value. Moreover, since the value of this parameter depends on the local part geometry, it can be used to optimize process settings during grinding. For example it may be used to guide adjustment of the feed rate as a function of location on the part to eliminate figure errors while minimizing the total grinding time required.

Paper Details

Date Published: 11 November 1999
PDF: 11 pages
Proc. SPIE 3782, Optical Manufacturing and Testing III, (11 November 1999); doi: 10.1117/12.369182
Show Author Affiliations
Paul D. Funkenbusch, Univ. of Rochester (United States)
Toshio Takahashi, Univ. of Rochester (United States)
Sheryl M. Gracewski, Univ. of Rochester (United States)
Jeffrey L. Ruckman, Univ. of Rochester (United States)

Published in SPIE Proceedings Vol. 3782:
Optical Manufacturing and Testing III
H. Philip Stahl, Editor(s)

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