Share Email Print
cover

Proceedings Paper

Noise measurement used for reliability screening of optoelectronic coupled devices (OCDs)
Author(s): Jiansheng Xu; Derek Abbott; Yisong Dai
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper the theoretical analysis of noise sources in OCDs is given and the relation between typical defects and 1/f, g-r and burst noise is described. According to statistical results, a threshold to screen potential devices with excess noise is derived. It has been proved both in theory and by experiment that the screening criterion proposed is reasonable. Moreover, the experimental results show that the screening method of OCDs is of practical value.

Paper Details

Date Published: 8 October 1999
PDF: 8 pages
Proc. SPIE 3893, Design, Characterization, and Packaging for MEMS and Microelectronics, (8 October 1999); doi: 10.1117/12.368428
Show Author Affiliations
Jiansheng Xu, Jilin Univ. of Technology (China)
Derek Abbott, Univ. of Adelaide (Australia)
Yisong Dai, Jilin Univ. of Technology (China)


Published in SPIE Proceedings Vol. 3893:
Design, Characterization, and Packaging for MEMS and Microelectronics
Bernard Courtois; Serge N. Demidenko, Editor(s)

© SPIE. Terms of Use
Back to Top