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Proceedings Paper

Thermal stress minimization in optical components coated with Ge-As-Se films
Author(s): Nicolai D. Savchenko
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Paper Abstract

Shear moduli for (As2Se3)1- yGey(0<EQy<EQ0.3)), (As2Se3)1- y(Ge2Se3)y (0<EQy<EQv1) glasses have been calculated by the linear combination of atomic orbitals method. Linear thermal expansion coefficients for As2Se3$, (As(subscript 2Se3)0.9Ge0.1, (As2Se3)0.7Ge0.3 and Ge33As12Se55 films have been derived from thermal stress measurements. Correlation between theoretical and experimental thermal stress values for amorphous films has been made. The availability of the total stress minimization in multilayer structures based on the films under consideration has been shown.

Paper Details

Date Published: 4 November 1999
PDF: 6 pages
Proc. SPIE 3890, Fourth International Conference on Material Science and Material Properties for Infrared Optoelectronics, (4 November 1999); doi: 10.1117/12.368386
Show Author Affiliations
Nicolai D. Savchenko, Uzhgorod State Univ. (Ukraine)


Published in SPIE Proceedings Vol. 3890:
Fourth International Conference on Material Science and Material Properties for Infrared Optoelectronics
Fiodor F. Sizov, Editor(s)

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