Share Email Print
cover

Proceedings Paper

Measurement of the X(2) distribution in poled nonlinear optical polymer films
Author(s): Robert Blum; Kersten Pfeifer; Gerrit Schoer; Andrej Ivankov; Manfred Eich
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We present a method for analyzing the homogeneity of the (chi) (2) distribution in poled nonlinear optical polymer films. The second order nonlinear coefficient in these polymers is commonly induced by electric field poling methods which can lead to a (chi) (2) distribution with poor spatial homogeneity. In this paper, we analyze the (chi) (2) distribution using scanning Kelvin microscopy. This allows us to detect the height and the direction of the induced polarization through the probing of the counter charges that are present on the polymer surface. We compare the response to that obtained from the scanning second harmonic microscopy (SSHM) method, in which the direction of the orientation, and thus the phase of (chi) (2), can not be seen. We also propose a method to measure the (chi) $_(2)) distribution in 3D by analyzing the SSHM images obtained at various wavelengths.

Paper Details

Date Published: 11 October 1999
PDF: 8 pages
Proc. SPIE 3796, Organic Nonlinear Optical Materials, (11 October 1999); doi: 10.1117/12.368293
Show Author Affiliations
Robert Blum, Technische Univ. Hamburg-Harburg (Germany)
Kersten Pfeifer, Technische Univ. Hamburg-Harburg (Germany)
Gerrit Schoer, Technische Univ. Hamburg-Harburg (Germany)
Andrej Ivankov, Technische Univ. Hamburg-Harburg (Germany)
Manfred Eich, Technische Univ. Hamburg-Harburg (Germany)


Published in SPIE Proceedings Vol. 3796:
Organic Nonlinear Optical Materials
Manfred Eich; Manfred Eich; Mark G. Kuzyk, Editor(s)

© SPIE. Terms of Use
Back to Top