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Proceedings Paper

PbI2 for high-resolution digital x-ray imaging
Author(s): Kanai S. Shah; Paul R. Bennett; Yuriy N. Dmitriyev; Leonard J. Cirignano; Misha Klugerman; Michael R. Squillante; Robert A. Street; Jeffrey T. Rahn; Steve E. Ready
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Paper Abstract

In this paper, we discuss recent progress that has been made in the development of high resolution X-ray imaging detectors using photoconducting films of lead iodide (PbI2). PbI2 is a wide bandgap semiconductor with high X- ray stopping efficiency. We have been investigating thick films of lead iodide which can be prepared in large areas in a cost effective manner. These films can be coupled to readout technologies such as amorphous silicon flat panel arrays and vidicon tubes to produce X-ray imaging detectors for applications such as mammography, fluoroscopy, X-ray diffraction and non-destructive evaluation. Recent results obtained when these PbI2 films are coupled to 512 X 512 flat panel a-Si:H array are reported. This includes dark current, signal and resolution measurements. Properties of lead iodide films which are relevant to imager performance are also discussed.

Paper Details

Date Published: 6 October 1999
PDF: 8 pages
Proc. SPIE 3770, Medical Applications of Penetrating Radiation, (6 October 1999); doi: 10.1117/12.368179
Show Author Affiliations
Kanai S. Shah, Radiation Monitoring Devices, Inc. (United States)
Paul R. Bennett, Radiation Monitoring Devices, Inc. (United States)
Yuriy N. Dmitriyev, Radiation Monitoring Devices, Inc. (United States)
Leonard J. Cirignano, Radiation Monitoring Devices, Inc. (United States)
Misha Klugerman, Radiation Monitoring Devices, Inc. (United States)
Michael R. Squillante, Radiation Monitoring Devices, Inc. (United States)
Robert A. Street, Xerox Palo Alto Research Ctr. (United States)
Jeffrey T. Rahn, Xerox Palo Alto Research Ctr. (United States)
Steve E. Ready, Xerox Palo Alto Research Ctr. (United States)


Published in SPIE Proceedings Vol. 3770:
Medical Applications of Penetrating Radiation
H. Bradford Barber; Hans Roehrig, Editor(s)

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