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Proceedings Paper

Position-sensitive ionization chamber for diffraction studies at synchrotron sources
Author(s): Kazumichi Sato; Hidenori Toyokawa; Yoshiki Kohmura; Tetsuya Ishikawa; Masayo Suzuki
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Paper Abstract

A position-sensitive ionization chamber has been developed with backgammon-type-segmented electrodes. This novel detector possesses a linear range of 8 mm for determining the incident position of the X-ray beam incoming. The position resolution was found to be better than 10 micrometers , probably close the sub-micrometer region. Owing to its high spatial resolution, the position-sensitive ionization chamber was able to commit that the gradual decrease observed in the X-ray beam intensity at the BL44B2 of the SPring-8 facility was mainly due to the spatial variation of the X-ray beam position in time. The present work also confirmed the applicability of the novel detector to the feedback correction system for the beam stabilization.

Paper Details

Date Published: 6 October 1999
PDF: 8 pages
Proc. SPIE 3774, Detectors for Crystallography and Diffraction Studies at Synchrotron Sources, (6 October 1999); doi: 10.1117/12.367117
Show Author Affiliations
Kazumichi Sato, RIKEN--The Institute of Physical and Chemical Research (Japan)
Hidenori Toyokawa, Japan Synchrotron Radiation Research Institute (Japan)
Yoshiki Kohmura, RIKEN-Institute of Physical and Chemical Research (Japan)
Tetsuya Ishikawa, RIKEN--Institute of Physical and Chemical Research and Japan Synchrotron Radiation Researc (Japan)
Masayo Suzuki, Japan Synchrotron Radiation Research Institute (Japan)


Published in SPIE Proceedings Vol. 3774:
Detectors for Crystallography and Diffraction Studies at Synchrotron Sources
George W. Fraser; Edwin M. Westbrook; Gareth E. Derbyshire, Editor(s)

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