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Proceedings Paper

Avalanche photodiode array sensor with high-speed CCD delay line readout
Author(s): Kevin L. Albright; Jeffrey M. Bradley
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Paper Abstract

A prototype solid-state multi-chip-module (MCM) optical sensor circuit is described. The MCM is designed to sample the optical signals from a fiber-optic array at rates up to 200 MHz. The fiber-optic inputs interface to the MCM avalanche-photodiode (APD) sensor array. The prototype 40 pixel MCM stores approximately 1000 samples from each fiber before readout. This is done on the MCM using high-speed charge-injection input CCD delay line ICs. The MCM is designed to be cooled to 0 degrees C. This stabilizes the APD gain and minimizes dark current generation in the APD and the CCD delay line.

Paper Details

Date Published: 26 October 1999
PDF: 5 pages
Proc. SPIE 3794, Materials and Electronics for High-Speed and Infrared Detectors, (26 October 1999); doi: 10.1117/12.366740
Show Author Affiliations
Kevin L. Albright, Los Alamos National Lab. (United States)
Jeffrey M. Bradley, Los Alamos National Lab. (United States)


Published in SPIE Proceedings Vol. 3794:
Materials and Electronics for High-Speed and Infrared Detectors
Walter F. Kailey; Stephen M. Goodnick; Randolph E. Longshore; Walter F. Kailey; Randolph E. Longshore; YongHang Zhang, Editor(s)

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