Share Email Print
cover

Proceedings Paper

Application of general sticking coefficient models to spacecraft contamination analysis
Author(s): Chien W. Chang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

General sticking coefficient models have been developed at LMMS for both unexcited molecules (no photochemical reaction effects) and photochemically excited molecules in a solar vacuum ultraviolet radiation environment. This paper describes applications of these models to spacecraft on-orbit contamination analysis. The first (non-photochemical) model was used for evaluation of internal contamination problem for an Earth-viewing instrument. The model examined potential molecular contamination to an instrument mirror from Chemglaze Z306 paint outgassing during the orbital flight. The model was correlated with available Chemglaze Z306 outgassing test data at a source temperature of 75 degrees Celsius and was then used to predict mirror deposition buildup under a relatively low source temperature of 30 degrees Celsius during 5-year mission flight. The second (photochemical) model correlated with measured photochemical contaminant deposition rates was used for examination of solar absorptance degradation of OSR (Optical Solar Reflector) radiators on a geosynchronous spacecraft in orbit for 10 years. The predicted degradation due to the photochemical reactions induced by solar vacuum ultraviolet radiation on spacecraft contaminants agrees well with flight data.

Paper Details

Date Published: 25 October 1999
PDF: 10 pages
Proc. SPIE 3784, Rough Surface Scattering and Contamination, (25 October 1999); doi: 10.1117/12.366714
Show Author Affiliations
Chien W. Chang, Lockheed Martin Missiles & Space (United States)


Published in SPIE Proceedings Vol. 3784:
Rough Surface Scattering and Contamination
Zu-Han Gu; Philip T. C. Chen; Zu-Han Gu; Alexei A. Maradudin; Alexei A. Maradudin, Editor(s)

© SPIE. Terms of Use
Back to Top