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Proceedings Paper

Efficient soft x-ray lasing at wavelengths of 20 to 30 nm
Author(s): Jie Zhang; Y. Q. Gu; Yinjun Li; Yutong Li; Shutai Chun-Yu; Y. L. You; WenZhong Huang; S. T. He; Y. L. He; L. Z. Lu; Xiaodong Yuan; XiaoFeng Wei; Chuanfei Zhang
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Paper Abstract

Intense lasing at 18.9, 20.3 and 28.5 nm from nickel-like molybdenum, niobium and neon-like chromium ions has been observed by using two 200 ps laser pulses with a total energy of 50 J at 1.053 micrometers from XingGuang II laser facility. This shows the possibility of extending nickel- like and neon-like x-ray lasing in low-Z elements and paves the way towards small scale x-ray lasers for applications at university laboratories. A comparison has been made of performance of the neon-like chromium soft x-ray lasing at 28.5 nm driven by a double 900 ps pulse at 6 TW(DOT)cm-2, with that driven by a double 200 ps pulse at similar irradiance. The double 200 ps pulse has been found to be more efficient to drive the neon-like x-ray lasing.

Paper Details

Date Published: 21 October 1999
PDF: 6 pages
Proc. SPIE 3776, Soft X-Ray Lasers and Applications III, (21 October 1999); doi: 10.1117/12.366657
Show Author Affiliations
Jie Zhang, Institute of Physics (China)
Y. Q. Gu, Institute of Nuclear Physics and Chemistry (China)
Yinjun Li, Institute of Physics and Institute of Nuclear Physics and Chemistry (China)
Yutong Li, Institute of Physics and Institute of Nuclear Physics and Chemistry (China)
Shutai Chun-Yu, Institute of Nuclear Physics and Chemistry (China)
Y. L. You, Institute of Nuclear Physics and Chemistry (China)
WenZhong Huang, Institute of Nuclear Physics and Chemistry (China)
S. T. He, Institute of Nuclear Physics and Chemistry (China)
Y. L. He, Institute of Nuclear Physics and Chemistry (China)
L. Z. Lu, Institute of Nuclear Physics and Chemistry (China)
Xiaodong Yuan, Institute of Nuclear Physics and Chemistry (China)
XiaoFeng Wei, Institute of Nuclear Physics and Chemistry (China)
Chuanfei Zhang, Institute of Nuclear Physics and Chemistry (China)


Published in SPIE Proceedings Vol. 3776:
Soft X-Ray Lasers and Applications III
Jorge J. G. Rocca; Luiz Barroca Da Silva, Editor(s)

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