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Proceedings Paper

Exploratory search for improved oxidizing agents used in the reduction of surface leakage currents of CdZnTe detectors
Author(s): Gomez W. Wright; Douglas Chinn; Bruce Andrew Brunett; Mark J. Mescher; James C. Lund; Richard W. Olsen; F. Patrick Doty; Tuviah E. Schlesinger; Ralph B. James; Kaushik Chattopadhyay; Robert Cam Wingfield; Arnold Burger
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Paper Abstract

We have studied the ability of different oxidizing agents, other than H2O2 to reduce the surface leakage current of CdZnTe devices. All chemical treatments were performed in aqueous solutions, at room temperature, with weight percent concentrations of 2.5g/25ml. Before and after I-V curves were obtained. It was found that by increasing the basicity of the chemical treatment, greater reduction in surface leakage current occurred. The result show that these alternative chemical treatments reduced the surface leakage current as well as or better than H2O2 chemical treatment.

Paper Details

Date Published: 19 October 1999
PDF: 5 pages
Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); doi: 10.1117/12.366617
Show Author Affiliations
Gomez W. Wright, Sandia National Labs. (United States)
Douglas Chinn, Sandia National Labs. (United States)
Bruce Andrew Brunett, Sandia National Labs. (United States)
Mark J. Mescher, Sandia National Labs. (United States)
James C. Lund, Sandia National Labs. (United States)
Richard W. Olsen, Sandia National Labs. (United States)
F. Patrick Doty, Sandia National Labs. (United States)
Tuviah E. Schlesinger, Sandia National Labs. (United States)
Ralph B. James, Sandia National Labs. (United States)
Kaushik Chattopadhyay, Fisk Univ. (United States)
Robert Cam Wingfield, Fisk Univ. (United States)
Arnold Burger, Fisk Univ. (United States)

Published in SPIE Proceedings Vol. 3768:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics
Ralph B. James; Richard C. Schirato, Editor(s)

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