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Proceedings Paper

Comparison of the radiation damage induced by thermal neutrons in CdTe and CdZnTe detectors
Author(s): Piero L. Chirco; MariaPia Morigi; Martina Zanarini; Anna D.M. Cavallini; B. Fraboni; Natalia Auricchio; Ezio Caroli; Waldes Dusi; Paul Fougeres; Makram Hage-Ali; Paul Siffert
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Paper Abstract

In recent years, room temperature semiconductor detectors like CdTe and CdZnTe have been proposed for several scientific, industrial and medical applications. In some cases, these applications require the capability to operate for a long time in intense, sometimes mixed, radiation fields while retaining full spectroscopic performances. In spite of its importance, a detailed characterization of the effects of the radiation damage has not been competed yet for these materials. However, preliminary results carried out by irradiating CdTe detectors with 60Co gamma rays demonstrated that the fatal photon dose is on the order of some tens of thousands Gy, while the detectors are rather insensitive to doses up to few thousands Gy. A wider activity is now being performed by the authors studying both the CdTe and the CdZnTe when involving several types of irradiating sources and different techniques to quantify the induced damaging. This includes the detailed quantitative analysis of retained spectroscopic performances at low and medium energies, the measurement of the dark current and the characterization of the defects and modifications induced in the structure of the crystal by the irradiation process.

Paper Details

Date Published: 19 October 1999
PDF: 9 pages
Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); doi: 10.1117/12.366609
Show Author Affiliations
Piero L. Chirco, Univ. di Bologna and INFN (Italy)
MariaPia Morigi, Univ. di Bologna and INFN (Italy)
Martina Zanarini, Univ. di Bologna and INFN (Italy)
Anna D.M. Cavallini, Univ. di Bologna and INFM (Italy)
B. Fraboni, Univ. di Bologna and INFM (Italy)
Natalia Auricchio, Istituto TESRE/CNR (Italy)
Ezio Caroli, Istituto TESRE/CNR (Italy)
Waldes Dusi, Istituto TESRE/CNR (Italy)
Paul Fougeres, EURORAD II-VI (France)
Makram Hage-Ali, CNRS/Lab. PHASE (France)
Paul Siffert, CNRS/Lab. PHASE (France)


Published in SPIE Proceedings Vol. 3768:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics
Ralph B. James; Richard C. Schirato, Editor(s)

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