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Proceedings Paper

Monte Carlo simulator for x-ray spectra analysis of GaAs detectors
Author(s): Adriano Cola; Lino Reggiani; Lorenzo Vasanelli
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Paper Abstract

We have developed a Monte Carlo simulator for semi- insulating GaAs detectors which gives the energy spectra of x-ray radiations. The simulated spectra are analyzed in terms of: shaping time, trapping properties of the material, and applied reverse voltage. The main features of the spectra as well as the associated charge collection efficiency and the energy resolution of the photoelectric peak are interpreted in physical terms for the whole range of applied voltages covering under- and over-depleted conditions. The results of the simulations provide a general interpretation scheme which is satisfactorily tested with experimental results.

Paper Details

Date Published: 19 October 1999
PDF: 8 pages
Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); doi: 10.1117/12.366604
Show Author Affiliations
Adriano Cola, Istituto per lo Studio de nuovi Materiali per l'Elettronica (Italy)
Lino Reggiani, INFM (Italy)
Lorenzo Vasanelli, Istituto per lo Studio di nuovi Materiali per l'Elettronica and INFM (Italy)


Published in SPIE Proceedings Vol. 3768:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics
Ralph B. James; Richard C. Schirato, Editor(s)

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