Share Email Print
cover

Proceedings Paper

Optical engineering and characterization of the internal electric field of CdZnTe radiation detectors
Author(s): H. Walter Yao; Ralph B. James; Jay Chris Erickson
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new method of engineering the internal electric field of CdZnTe (CZT) radiation detectors will be introduced. The internal electric field distribution within a CZT detector is engineered via an IR beam with a special photon energy and characterized by a separate polarized optical transmission profile beam utilizing the Pockels electro- optic effect. A theoretical model and calculation will be presented to understand the internal electric field engineering we have performed in our work. 2D images reflecting the internal electrical field intensity changes will be shown and the application of this field engineering method to improve the radiation detectors will be discussed.

Paper Details

Date Published: 19 October 1999
PDF: 9 pages
Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); doi: 10.1117/12.366598
Show Author Affiliations
H. Walter Yao, Univ. of Nebraska/Lincoln and Sandia National Labs. (United States)
Ralph B. James, Sandia National Labs. (United States)
Jay Chris Erickson, Univ. of Nebraska/Lincoln and Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 3768:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics
Ralph B. James; Richard C. Schirato, Editor(s)

© SPIE. Terms of Use
Back to Top