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Proceedings Paper

Formation mechanism of photostimulable centers in image plate phosphors
Author(s): Martin Hoben; Roland Schmechel; Ruediger Henn; Heinz von Seggern
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Paper Abstract

In image plate technology the understanding of the radiation-induced generation of photostimulable luminescence centers (PSLCs) is still an unsolved problem in commercially utilized x-ray storage phosphors, such as BaFBr: Eu2+ and RbBr:Tl+. Two different mechanisms have been proposed: the first one assumes a vacancy-free crystal prior to irradiation known as Itoh process originally proposed for alkali halides whereas the second one relies on a vacancy- containing crystal where the vacancies are assumed to be F+-centers. In the present study we area addressing this problem through the determination of the relative concentrations of spatially-correlated and non-correlated centers for samples with different activator concentrations. The PSLC-concentration ratio meaning the concentration of the spatially correlated centers to the total center concentration is measured by means of photostimulated luminescence in the temperature range from LHe to room temperature. It is found that the Eu2+-concentration is playing a decisive role in the relative occurrence of the two PSLC-types in the sense that for higher Eu2+- contents the ratio of correlated to non-correlated centers is increasing. It will be shown that this result clearly favors the Itoh formation mechanism for x-irradiation induced PSLC generation.

Paper Details

Date Published: 19 October 1999
PDF: 8 pages
Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); doi: 10.1117/12.366592
Show Author Affiliations
Martin Hoben, Darmstadt Univ. of Technology (Germany)
Roland Schmechel, Darmstadt Univ. of Technology (Germany)
Ruediger Henn, Darmstadt Univ. of Technology (Germany)
Heinz von Seggern, Darmstadt Univ. of Technology (Germany)


Published in SPIE Proceedings Vol. 3768:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics
Ralph B. James; Richard C. Schirato, Editor(s)

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