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Proceedings Paper

Novel x-ray silicon detector for 2D imaging and high-resolution spectroscopy
Author(s): Andrea Castoldi; Emilio Gatti; Chiara Guazzoni; Antonio Longoni; Pavel Rehak; Lothar Strueder
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Paper Abstract

A novel x-ray silicon detector for 2D imaging has been recently proposed. The detector, called Controlled-Drift Detector, is operated in integrate-readout mode. Its basic feature is the fast transport of the integrated charge to the output electrode by means of a uniform drift field. The drift time of the charge packet identifies the pixel of incidence. A new architecture to implement the Controlled- Drift Detector concept will be presented. The potential wells for the integration of the signal charge are obtained by means of a suitable pattern of deep n-implants and deep p-implants. During the readout mode the signal electrons are transferred in the drift channel that flanks each column of potential wells where they drift towards the collecting electrode at constant velocity. The first experimental measurements demonstrate the successful integration, transfer and drift of the signal electrons. The low output capacitance of the readout electrode together with the on- chip front-end electronics allows high resolution spectroscopy of the detected photons.

Paper Details

Date Published: 19 October 1999
PDF: 9 pages
Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); doi: 10.1117/12.366588
Show Author Affiliations
Andrea Castoldi, Politecnico di Milano (Italy)
Emilio Gatti, Politecnico di Milano (Italy)
Chiara Guazzoni, Politecnico di Milano (Italy)
Antonio Longoni, Politecnico di Milano (Italy)
Pavel Rehak, Brookhaven National Lab. (United States)
Lothar Strueder, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)


Published in SPIE Proceedings Vol. 3768:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics
Ralph B. James; Richard C. Schirato, Editor(s)

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