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Proceedings Paper

New versatile x-ray analyzer using capillary focusing in the micrometer scale
Author(s): Charles Burggraf; Paul Fougeres; Chris Burggraf; Makram Hage-Ali; Jean Marie Koebel; A. Krauth; R. Regal; J. L. Baltzinger; Paul Siffert
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Paper Abstract

In this paper, we will give first the description of a versatile material analyzer for x-ray crystallographic and compositional analyses. We will describe how we calculate and elaborate glass capillaries; we will describe some important parameters of the total reflection of x-rays: focusing, transparency, gain and divergence. Our first results concern a compositional study of CdZnTe crystals with a n x-ray beam diameter of 10 micrometers and we will show the variation of Zn on the surface of such a crystal. Another possibility of this device is x-ray microtopography of a film or of a wafer. We show, on one hand the way to find in classical centers by Laue micropatterns on the other hand we could establish a Bragg reflection pattern like those obtained in classical x-ray surface topography. In some heat treatments we can see so-called texture effects. We have also on our device the possibility to see microtexture effects in a way which can be compared to the Seeman-Bohlin experiment. The compositional experiments were also tested by SEM in order to see how these two devices complete each other. We can notice in some studies the advantages of x-rays because photons are less destructive than electrons.

Paper Details

Date Published: 19 October 1999
PDF: 8 pages
Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); doi: 10.1117/12.366578
Show Author Affiliations
Charles Burggraf, CNRS/Lab. PHASE (France)
Paul Fougeres, EURORAD II-VI (France)
Chris Burggraf, CNRS/Lab. PHASE (France)
Makram Hage-Ali, CNRS/Lab. PHASE (France)
Jean Marie Koebel, CNRS/Lab. PHASE (France)
A. Krauth, CNRS/Lab. PHASE (France)
R. Regal, CNRS/Lab. PHASE (France)
J. L. Baltzinger, Univ. Louis Pasteur (France)
Paul Siffert, CNRS/Lab. PHASE (France)

Published in SPIE Proceedings Vol. 3768:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics
Ralph B. James; Richard C. Schirato, Editor(s)

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