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Proceedings Paper

Correlation between bulk material defects and spectroscopic response in cadmium zinc telluride detectors
Author(s): Bradford H. Parker; Carl Michael Stahle; Scott D. Barthelmy; Ann M. Parsons; Jack Tueller; J. T. VanSant; B. F. Munoz; S. J. Snodgrass; R. E. Mullinix
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Paper Abstract

One of the critical challenges for large area cadmium zinc telluride (CdZnTe) detector arrays is obtaining material capable of uniform imaging and spectroscopic response. Two complementary nondestructive techniques for characterizing bulk CdZnTe have been developed to identify material with a uniform response. The first technique, IR transmission imaging, allows for rapid visualization of bulk defects. The second technique, x-ray spectral mapping, provides a map of the material spectroscopic response when it is configured as a planar detector. The two techniques have been used to develop a correlation between bulk defect type and detector performance. The correlation allows for the use of IR imaging to rapidly develop wafer mining maps. The mining of material free of detrimental defects has the potential to dramatically increase the yield and quality of large area CdZnTe detector arrays.

Paper Details

Date Published: 19 October 1999
PDF: 9 pages
Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); doi: 10.1117/12.366576
Show Author Affiliations
Bradford H. Parker, NASA Goddard Space Flight Ctr. (United States)
Carl Michael Stahle, NASA Goddard Space Flight Ctr. (United States)
Scott D. Barthelmy, NASA Goddard Space Flight Ctr. and Universities Space Research Associates (United States)
Ann M. Parsons, NASA Goddard Space Flight Ctr. (United States)
Jack Tueller, NASA Goddard Space Flight Ctr. (United States)
J. T. VanSant, NASA Goddard Space Flight Ctr. (United States)
B. F. Munoz, NASA Goddard Space Flight Ctr. and Unisys Corp. (United States)
S. J. Snodgrass, NASA Goddard Space Flight Ctr. and Raytheon Systems Co. (United States)
R. E. Mullinix, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 3768:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics
Ralph B. James; Richard C. Schirato, Editor(s)

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