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Proceedings Paper

Constellation X-ray mission: implementation concept and science overview
Author(s): Harvey D. Tananbaum; Nicholas E. White; Jay A. Bookbinder; F. E. Marshall; F. A. Cordova
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Paper Abstract

The Constellation-X mission is a large collecting area x-ray facility, emphasizing observations at high spectral resolution while covering a broad energy band. By increasing the telescope aperture and utilizing efficient spectrometers the mission will achieve a factor of 100 increased sensitivity over current high resolution x-ray spectroscopy missions. The use of focusing optics across the 10-40 keV band will provide a similar factor of 100 increased sensitivity in this band. Key technologies under development for the mission include lightweight high throughput x-ray optics, multilayer coatings to enhance the hard x-ray performance of x-ray optics, micro-calorimeter spectrometer arrays with 2 eV resolution, low power and low weight CCD arrays, lightweight gratings and hard x-ray detectors. When observations commence towards the end of the next decade, Constellation-X will address many pressing questions concerning the extremes of gravity and the evolution of the Universe.

Paper Details

Date Published: 22 October 1999
PDF: 11 pages
Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); doi: 10.1117/12.366555
Show Author Affiliations
Harvey D. Tananbaum, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Nicholas E. White, NASA Goddard Space Flight Ctr. (United States)
Jay A. Bookbinder, Harvard-Smithsonian Ctr. for Astrophysics (United States)
F. E. Marshall, NASA Goddard Space Flight Ctr. (United States)
F. A. Cordova, Univ. of California/Santa Barbara (United States)


Published in SPIE Proceedings Vol. 3765:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X
Oswald H. W. Siegmund; Kathryn A. Flanagan, Editor(s)

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