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Proceedings Paper

Preliminary test results of a new high-energy-resolution silicon and CdZnTe pixel detectors for application to x-ray astronomy
Author(s): V. V. Sushkov; William J. Hamilton; Kevin C. Hurley; Dale G. Maeding; Hakki Ogelman; Robert J. Paulos; Richard Charles Puetter; Tumay O. Tumer; Jeffrey Zweerink
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Paper Abstract

New, high spatial resolution CdZnTe (CZT) and silicon (Si) pixel detectors are highly suitable for x-ray astronomy. These detectors are planned for use in wide field of view, imaging x-ray, and low energy gamma-ray all-sky monitor (AXGAM) in a future space mission. The high stopping power of CZT detectors combined with low-noise front-end readout makes possible an order of magnitude improvement in spatial and energy resolution in x-ray detection. The AXGAM instrument will be built in the form of a fine coded aperture placed over two-dimensional, high spatial resolution and low energy threshold CZT pixel detector array. The preliminary result of CZT and silicon pixel detector test with low-noise readout electronics system are presented. These detectors may also be used with or without modification for medical and industrial imaging.

Paper Details

Date Published: 22 October 1999
PDF: 9 pages
Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); doi: 10.1117/12.366518
Show Author Affiliations
V. V. Sushkov, Univ. of California/Riverside (United States)
William J. Hamilton, Raytheon Co. (United States)
Kevin C. Hurley, Univ. of California/Berkeley (United States)
Dale G. Maeding, Innovative Design (United States)
Hakki Ogelman, Univ. of Wisconsin/Madison (United States)
Robert J. Paulos, Univ. of Wisconsin/Madison (United States)
Richard Charles Puetter, Univ. of California/San Diego (United States)
Tumay O. Tumer, Univ. of California/Riverside (United States)
Jeffrey Zweerink, Univ. of California/Riverside (United States)


Published in SPIE Proceedings Vol. 3765:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X
Oswald H. W. Siegmund; Kathryn A. Flanagan, Editor(s)

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