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Proceedings Paper

Determination and correction of the charge transfer efficiency of the pn-CCD camera
Author(s): Konrad Dennerl; Ulrich G. Briel; Frank Haberl; Gisela D. Hartner; Norbert Krause; Martin Popp; V. E. Zavlin
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Paper Abstract

In CCDs part of the charge released by an absorbed photon is lost during transfer to the readout node. This loss depends on several parameters, in particular on the position where the photon was detected, its energy, the temperature of the CCD, and the saturation of traps by charges preceding along the readout direction. In order to determine how these parameters affect the charge loss of the pn-CCD cameras, we obtained extensive sets of calibration measurements form February 1998 to January 1999. More than three billion events were recorded in flatfield exposures. We present results of a detailed analysis of this data set and describe how they can be used to correct pn-CCD camera data for charge transfer loss.

Paper Details

Date Published: 22 October 1999
PDF: 12 pages
Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); doi: 10.1117/12.366505
Show Author Affiliations
Konrad Dennerl, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Ulrich G. Briel, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Frank Haberl, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Gisela D. Hartner, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Norbert Krause, Max-Planck-Institut fuer Extraterrestrische Physik (Australia)
Martin Popp, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
V. E. Zavlin, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)


Published in SPIE Proceedings Vol. 3765:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X
Oswald H. W. Siegmund; Kathryn A. Flanagan, Editor(s)

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