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Proceedings Paper

New event analysis method with the x-ray CCD camera XIS for ASTRO-E
Author(s): Hiroshi Murakami; Takeshi G. Tsuru; Hisamitsu Awaki; Masaaki Sakano; Mamiko Nishiuchi; Kenji Hamaguchi; Katsuji Koyama; Hiroshi Tsunemi
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Paper Abstract

We introduce a new method of event analysis with the x-ray CCD camera (XIS) on board the next Japanese X-ray astronomical satellite, Astro-E. In the ordinary method, we used 'grade' classification; we distinguished the x-ray events from background events by referring the shape and the extent of the charge-split pixels, because non x-ray events spread to many pixels. However, at the same time, this method lowered the quantum efficiency of high energy x-ray photons which also extend for several pixels. We tried the method with 2D image-fitting of each event. We succeeded in rejecting non x-ray events by the extent of fitted function. We achieved higher detection efficiency by 10 percent than the grade method for hard x-rays above 8 keV, while the energy resolution becomes worse by 0-8 percent. The improvements and the problems of this new method are also presented.

Paper Details

Date Published: 22 October 1999
PDF: 11 pages
Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); doi: 10.1117/12.366497
Show Author Affiliations
Hiroshi Murakami, Kyoto Univ. (Japan)
Takeshi G. Tsuru, Kyoto Univ. and Japan Science and Technology Corp. (Japan)
Hisamitsu Awaki, Kyoto Univ. and Japan Science and Technology Corp. (Japan)
Masaaki Sakano, Kyoto Univ. (Japan)
Mamiko Nishiuchi, Kyoto Univ. (Japan)
Kenji Hamaguchi, Kyoto Univ. (United States)
Katsuji Koyama, Kyoto Univ. and Japan Science and Technology Corp. (Japan)
Hiroshi Tsunemi, Osaka Univ. and Japan Science and Technology Corp. (Japan)


Published in SPIE Proceedings Vol. 3765:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X
Oswald H. W. Siegmund; Kathryn A. Flanagan, Editor(s)

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