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Proceedings Paper

Technology development for the Constellation-X hard-x-ray telescope
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Paper Abstract

In addition to high resolving power in the traditional x-ray band, the Constellation X-ray scientific goals require broad bandpass, with response extending to E >= 40 keV. To achieve this objective, Constellation-X will incorporate a hard x-ray telescope (HXT) based on depth graded multilayer- coated grazing incidence optics and position-sensitive solid state detectors. This paper describes the HXT performance requires, provides an overview of the HXT optics and detector technology development efforts, and present example designs.

Paper Details

Date Published: 22 October 1999
PDF: 8 pages
Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); doi: 10.1117/12.366492
Show Author Affiliations
Fiona A. Harrison, California Institute of Technology (United States)
Walter R. Cook, California Institute of Technology (United States)
Finn Erland Christensen, Danish Space Research Institute (Denmark)
Oberto Citterio, Osservatorio Astronomico di Brera (Italy)
William W. Craig, Columbia Univ. (United States)
Neil A. Gehrels, NASA Goddard Space Flight Ctr. (United States)
Paul Gorenstein, Smithsonian Astrophysical Observatory (United States)
Jonathan E. Grindlay, Harvard College Observatory (United States)
Charles J. Hailey, Columbia Univ. (United States)
Richard A. Kroeger, Naval Research Lab. (United States)
Hideyo Kunieda, Nagoya Univ. (Japan)
Giovanni Pareschi, Osservatorio Astronomico di Brera (Italy)
Ann M. Parsons, NASA Goddard Space Flight Ctr. (United States)
Robert Petre, NASA Goddard Space Flight Ctr. (United States)
Suzanne E. Romaine, Smithsonian Astrophysical Observatory (United States)
Brian D. Ramsey, NASA Marshall Space Flight Ctr. (United States)
Jack Tueller, NASA Goddard Space Flight Ctr. (United States)
Melville P. Ulmer, Northwestern Univ. (United States)
Martin C. Weisskopf, NASA Marshall Space Flight Ctr. (United States)
David L. Windt, Lucent Technologies/Bell Labs. (United States)


Published in SPIE Proceedings Vol. 3765:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X
Oswald H. W. Siegmund; Kathryn A. Flanagan, Editor(s)

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