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Proceedings Paper

Toward a 2-eV microcalorimeter x-ray spectrometer for Constellation-X
Author(s): Caroline Kilbourn Stahle; Simon R. Bandler; Troy W. Barbee; Jeffrey W. Beeman; Regis P. Brekosky; Blas Cabrera; Mark F. Cunningham; Steven W. Deiker; Enectali Figueroa-Feliciano; Fred M. Finkbeiner; Matthias A. Frank; Keith C. Gendreau; Eugene E. Haller; Gene C. Hilton; Kent D. Irwin; Richard L. Kelley; Simon E. Labov; Mary J. Li; Norman W. Madden; John M. Martinis; Dan McCammon; Sae Woo Nam; Frederick Scott Porter; Herbert W. Schnopper; Eric H. Silver; Andrew E. Szymkowiak; Gregory S. Tucker; Arthur B. C. Walker; D. A. Wollman
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Paper Abstract

COnstellation-X is a cluster of identical observatories that together constitute a promising concept for a next- generation, high-throughput, high-resolution, astrophysical x-ray spectroscopy mission. The heart of the Constellation-X mission concept is a high-quantum-efficiency imaging spectrometer with 2 eV resolution at 6 keV. Collectively across the cluster, this imaging spectrometer will have twenty times the collecting efficiency of XRS on Astro-E and better than 0.25 arc minute imaging resolution. The spectrometer on each satellite will be able to handle count rates of up to 1000 counts per second per imaging pixel for a point source and 30 counts per second per pixel for an extended source filling the array. Focal plane coverage of at least 2.5 arc minutes X arc minutes, comparable to XRS but with a factor of thirty more pixels, is required. This paper will present the technologies that have the potential to meet al these requirements. It will identify the ones chosen for development for Constellation-X and explain why those were considered closer to realization, and it will summarize the results of the development work thus far.

Paper Details

Date Published: 22 October 1999
PDF: 12 pages
Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); doi: 10.1117/12.366490
Show Author Affiliations
Caroline Kilbourn Stahle, NASA Goddard Space Flight Ctr. (United States)
Simon R. Bandler, Smithsonian Astrophysical Observatory (United States)
Troy W. Barbee, Lawrence Livermore National Lab. (United States)
Jeffrey W. Beeman, Lawrence Berkeley National Lab. (United States)
Regis P. Brekosky, NASA Goddard Space Flight Ctr. (United States)
Blas Cabrera, Stanford Univ. (United States)
Mark F. Cunningham, Lawrence Livermore National Lab. (United States)
Steven W. Deiker, National Institute of Standards and Technology (United States)
Enectali Figueroa-Feliciano, NASA Goddard Space Flight Ctr. and Stanford Univ. (United States)
Fred M. Finkbeiner, NASA Goddard Space Flight Ctr. (United States)
Matthias A. Frank, Lawrence Livermore National Lab. (United States)
Keith C. Gendreau, NASA Goddard Space Flight Ctr. (United States)
Eugene E. Haller, Lawrence Berkeley National Lab. (United States)
Gene C. Hilton, National Institute of Standards and Technology (United States)
Kent D. Irwin, National Institute of Standards and Technology (United States)
Richard L. Kelley, NASA Goddard Space Flight Ctr. (United States)
Simon E. Labov, Lawrence Livermore National Lab. (United States)
Mary J. Li, NASA Goddard Space Flight Ctr. (United States)
Norman W. Madden, Lawrence Berkeley National Lab. (United States)
John M. Martinis, National Institute of Standards and Technology (United States)
Dan McCammon, Univ. of Wisconsin/Madison (United States)
Sae Woo Nam, National Institute of Standards and Technology (United States)
Frederick Scott Porter, NASA Goddard Space Flight Ctr. (United States)
Herbert W. Schnopper, Smithsonian Astrophysical Observatory (United States)
Eric H. Silver, Smithsonian Astrophysical Observatory (United States)
Andrew E. Szymkowiak, NASA Goddard Space Flight Ctr. (United States)
Gregory S. Tucker, Brown Univ. (United States)
Arthur B. C. Walker, Stanford Univ. (United States)
D. A. Wollman, National Institiute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 3765:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X
Oswald H. W. Siegmund; Kathryn A. Flanagan, Editor(s)

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