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Proceedings Paper

Modeling of polarized light scattering in cirrus clouds: validation with in-situ measurements and ADEOS-POLDER reflectance observations
Author(s): Laurent C. Labonnote; Gerard Brogniez; Jean-Francois Gayet; Jean-Claude Buriez; Marie Doutriaux-Boucher
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Paper Abstract

Various in situ measurements of the light scattering diagram in cirrus clouds with a new airborne nephelometer, have been performed using several airborne campaigns. These measurements have been favorably compared with a theoretical scattering model. This model consists in computing the scattering of light by an ensemble of randomly oriented hexagonal ice crystals containing spherical impurities of soot and air bubbles. It is achieved by using a combination of ray-tracing, Mie theory,k and Monte-Carlo techniques. It allows to retrieve the six independent elements of these scattering matrix, and results are favorably compared with in situ nephelometer measurements. This good agreement provide an opportunity to use this model in order to analyze ADEOS-POLDER reflectance measurements over cirrus clouds. POLDER uses an original concept to observe cirrus clouds properties, especially because reflectances and polarized reflectances are measured, for a given scene, under several viewing directions. A first analysis of cirrus cloud spherical albedos over the terrestrial globe for November 10, 1996, shows a rather good agreement between measurement and modeling. Moreover, polarized reflectances are also calculated and show a satisfactory with measurements.

Paper Details

Date Published: 25 October 1999
PDF: 9 pages
Proc. SPIE 3754, Polarization: Measurement, Analysis, and Remote Sensing II, (25 October 1999); doi: 10.1117/12.366341
Show Author Affiliations
Laurent C. Labonnote, Univ. des Sciences et Technologies de Lille (France)
Gerard Brogniez, Univ. des Sciences et Technologies de Lille (France)
Jean-Francois Gayet, Univ. Blaise Pascal (France)
Jean-Claude Buriez, Univ. des Sciences et Technologies de Lille (France)
Marie Doutriaux-Boucher, Univ. des Sciences et Technologies de Lille (France)


Published in SPIE Proceedings Vol. 3754:
Polarization: Measurement, Analysis, and Remote Sensing II
Dennis H. Goldstein; David B. Chenault, Editor(s)

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