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Proceedings Paper

Infrared parallel-slab division-of-amplitude photopolarimeter
Author(s): Aed M. El-Saba; Rasheed M. A. Azzam; Mustafa A. G. Abushagur; Christopher L. Centamore; Allison Leigh Arp
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Paper Abstract

In this paper we describe novel designs of IR versions of the parallel-slab division-of-amplitude photopolarimeter (IR-PS-DOAP) to measure the state of polarization of light as determined by the four Stokes parameters. The IR-PS-DOAP uses no movable parts or modulation and thus fast and simultaneous measurement is obtained. We present two different designs. The first employs a uniform, thin, transparent, film coating on the front surface of the parallel-slab. The second employs strips of thin, transparent, film coating on the front surface of the parallel-slab. A performance analysis comparison between the two will be presented. For wavelengths up to approximately 3.5 micrometers , SiO2, is totally transparent and is selected to be the slab material for the IR-PS-DOAP. For wavelengths beyond 3.5 micrometers , SiO2 becomes absorbent and will be replaced by another transparent material like Irtran2, for example. The instrument matrix of the system is non- singular; hence the state of polarization is completely determined. The IR-PS-DOAP is compact, light-weight, rugged and based on reflective optics, so that predictive theory of instrument performance is applicable.

Paper Details

Date Published: 25 October 1999
PDF: 14 pages
Proc. SPIE 3754, Polarization: Measurement, Analysis, and Remote Sensing II, (25 October 1999); doi: 10.1117/12.366334
Show Author Affiliations
Aed M. El-Saba, Univ. of Alabama in Huntsville (United States)
Rasheed M. A. Azzam, American Univ. in Cairo (United States)
Mustafa A. G. Abushagur, Univ. of Alabama in Huntsville (United States)
Christopher L. Centamore, Univ. of Alabama in Huntsville (United States)
Allison Leigh Arp, Univ. of Alabama in Huntsville (United States)


Published in SPIE Proceedings Vol. 3754:
Polarization: Measurement, Analysis, and Remote Sensing II
Dennis H. Goldstein; David B. Chenault, Editor(s)

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