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Proceedings Paper

Return-path polarimeter for two-dimensional birefringence distribution measurement
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Paper Abstract

The paper covers an issue of method and device for measurement of 2D retardance and principal plane azimuth distributions. The system based on the use of a laser return-path polarimeter which consists of a rotating polarizing beam splitter and a quarter wave plate. Two or four sets from four images are used for birefringence analysis. This allows to decrease the errors caused by imperfection of a polarizing beam splitter and a quarter wave plate. The basic expressions that describe the operation of the systems are presented. The main sources of error are discussed. The measured results of the 2D birefringence distribution of a plastic and standard phase plate of retardation are shown.

Paper Details

Date Published: 25 October 1999
PDF: 6 pages
Proc. SPIE 3754, Polarization: Measurement, Analysis, and Remote Sensing II, (25 October 1999); doi: 10.1117/12.366325
Show Author Affiliations
Michael I. Shribak, Tokyo Univ. of Agriculture and Technology (United States)
Yukitoshi Otani, Tokyo Univ. of Agriculture and Technology (Japan)
Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan)


Published in SPIE Proceedings Vol. 3754:
Polarization: Measurement, Analysis, and Remote Sensing II
Dennis H. Goldstein; David B. Chenault, Editor(s)

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