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Proceedings Paper

Polarimetric characterization of Spectralon
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Paper Abstract

A polarimetric characterization of the reflective standard material Spectralon is presented. Samples of Spectralon with reflectances of 2 percent, 50 percent, 75 percent and 99 percent were examined. The characterization was accomplished using the Air Force Research Laboratory's spectropolarimeter in reflection mode. Data are presented for the spectral region .65 to 1.0 micrometers. Polarizance was measured for the four Spectralon samples at eight input beam incidence angles. All observations were made from normal to the Spectralon. It was found that as the incidence beam angle increases, the polarizance increases; and as the reflectance of the samples decreases, the polarizance increases.

Paper Details

Date Published: 25 October 1999
PDF: 11 pages
Proc. SPIE 3754, Polarization: Measurement, Analysis, and Remote Sensing II, (25 October 1999); doi: 10.1117/12.366323
Show Author Affiliations
Dennis H. Goldstein, Air Force Research Lab. (United States)
David B. Chenault, SY Technology, Inc. (United States)
J. Larry Pezzaniti, SY Technology, Inc. (United States)

Published in SPIE Proceedings Vol. 3754:
Polarization: Measurement, Analysis, and Remote Sensing II
Dennis H. Goldstein; David B. Chenault, Editor(s)

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