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Proceedings Paper

Evidence of enhanced fluorescence via cross coupling in an integrated thin-film fluorescence sensor
Author(s): Meg L. Tuma; Russell W. Gruhlke; Thomas G. Brown
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Paper Abstract

A fluorescence sensor-system has been proposed that integrates optical and electronic components in a thin-film geometry. Predicted properties of this sensor include: increased sensitivity, shielding form unwanted radiation, wavelength filtering, potential operation at high temperatures, and miniaturization. The sensor can be tuned to measure a wide variety of species by varying its thin- film corrugation period. The optical properties of the sensor are determined, in large part, by optical cross coupling through a corrugated metal film and enhanced fluorescence. Measurements evaluating these processes are presented.

Paper Details

Date Published: 13 October 1999
PDF: 8 pages
Proc. SPIE 3783, Optical Diagnostics for Fluids/Heat/Combustion and Photomechanics for Solids, (13 October 1999); doi: 10.1117/12.365754
Show Author Affiliations
Meg L. Tuma, NASA Glenn Research Ctr. (United States)
Russell W. Gruhlke, Breault Research Organization, Inc. (United States)
Thomas G. Brown, The Institute of Optics/Univ. of Rochester (United States)

Published in SPIE Proceedings Vol. 3783:
Optical Diagnostics for Fluids/Heat/Combustion and Photomechanics for Solids
Soyoung Stephen Cha; Peter John Bryanston-Cross; Carolyn R. Mercer, Editor(s)

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