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Proceedings Paper

Microwave sensors for nondestructive testing of materials
Author(s): Tuami Lasri; David Glay; Ahmed Mamouni; Yves Leroy
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Paper Abstract

Much of today's applications in nondestructive testing by microwaves use an automatic network analyzer. As a result, there is a need for systems to reduce the cost of this kind of techniques. Fortunately, now we can benefit from the cost reduction of the microwave components, induced by the considerable development of the communication market, around 2 and 10 GHz. So, it seems reasonable to think that microwaves will take advantage of this new situation to assert themselves in this application field. In this context we conceive and develop original equipment competitive in term of price and reliability.

Paper Details

Date Published: 15 October 1999
PDF: 10 pages
Proc. SPIE 3752, Subsurface Sensors and Applications, (15 October 1999); doi: 10.1117/12.365711
Show Author Affiliations
Tuami Lasri, Institut d'Electronique et de Microelectronique du Nord, Univ. de Lille (France)
David Glay, Institut d'Electronique et de Microelectronique du Nord, Univ. de Lille (France)
Ahmed Mamouni, Institut d'Electronique et de Microelectronique du Nord, Univ. de Lille (France)
Yves Leroy, Institut d'Electronique et de Microelectronique du Nord, Univ. de Lille (France)


Published in SPIE Proceedings Vol. 3752:
Subsurface Sensors and Applications
Cam Nguyen, Editor(s)

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