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Proceedings Paper

Correlation spectral analyzer of extended light sources
Author(s): Yuri A. Bykovsky; Anatoly A. Markilov; Vladislav Gennadyevich Rodin; Sergey N. Starikov
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Paper Abstract

There is a whole class of spectral devices for light sources' emission spectral analysis. By analysis of a such type spectra of extended light sources the procedure of scanning the source surface is usually applied. The methodics on extended light sources' emission spectral analysis based on the correlation processing the space and spectral parameters is offered. As input object in the correlator the complex extended scale-invariant mask was used. The use of this mask allows to exclude a procedure of scanning the source surface by analysis. As a resolution element of such spectral analyzer the located spatial autocorrelation signal of the input mask is used. The experimental scheme of correlation spectral analyzer is created. The output plane calibration of the device with the light spectral structure to be determined is conducted. The results on extended light sources' emission spectral analysis are described. In experiments the spectral resolution of the device is determined as 1 nm. The use of such spectral analyzer allows to construct system of the spectral analysis with large speed without application of scanning devices.

Paper Details

Date Published: 24 September 1999
PDF: 5 pages
Proc. SPIE 3900, 3rd International Conference on Optical Information Processing, (24 September 1999); doi: 10.1117/12.364562
Show Author Affiliations
Yuri A. Bykovsky, Moscow Engineering Physics Institute (Russia)
Anatoly A. Markilov, Moscow Engineering Physics Institute (Russia)
Vladislav Gennadyevich Rodin, Moscow Engineering Physics Institute (Russia)
Sergey N. Starikov, Moscow Engineering Physics Institute (Russia)


Published in SPIE Proceedings Vol. 3900:
3rd International Conference on Optical Information Processing
Yuri V. Gulyaev, Editor(s)

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