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Proceedings Paper

Industrial measurement of birefringence of optical components
Author(s): Peter Kohns
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Paper Abstract

We present a polarization measuring system for industrial applications. The system consists of a polarization state generator and a polarization sensitive detector consisting of a rotating waveplate, a polarizer, and a detector. A fast Fourier algorithm provides the four Stokes parameters of the light where all parameters are calculated independently. By tuning the polarization of the illuminating light we calculate the Jones matrix and the birefringence of the sample. A high accuracy is achieved by considering the fact that the transmission of the rotating waveplate in the detector depends on the polarization of the studied light. The system delivers the birefringence, the azimuth of the fast axis, the Jones matrix, and the eigenpolarizations of the sample under test. Under industrial conditions we found an accuracy of the stress birefringence of 0.1 nm and an accuracy of the azimuth of the fast axis of 0.1 degree.

Paper Details

Date Published: 16 September 1999
PDF: 10 pages
Proc. SPIE 3826, Polarization and Color Techniques in Industrial Inspection, (16 September 1999); doi: 10.1117/12.364326
Show Author Affiliations
Peter Kohns, Instrument Systems GmbH (Germany)


Published in SPIE Proceedings Vol. 3826:
Polarization and Color Techniques in Industrial Inspection
Elzbieta A. Marszalec; Emanuele Trucco, Editor(s)

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