Share Email Print

Proceedings Paper

Three-dimensional pulsed ESPI technique of analysis of dynamic problems
Author(s): Zhiguo Wang; Thomas Walz; H. R. Schubach; Andreas Ettemeyer
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Pulsed ESPI techniques have been developed during the last years to replace conventional double pulse holography interferometer for analysis of dynamic behavior of components. The main benefits of holography towards conventional measuring techniques have already been known as field and non-contact measurement results. Recent developments have extended the capabilities of pulsed ESPI techniques to 3D measurement of dynamic behavior. The object under investigation is illuminated with the light of a pulsed laser and simultaneously observed from 3 different directions with 3 ESPI cameras. The measuring results from the 3 cameras are representing the deformation field in the 3 sensitivity directions of the optical set-up. The optical image distortion due to the different viewing angles of the 3 cameras is automatically compensated and the complete 3D-deformation vector is calculated on every point of the inspected surface. Recent industrial applications of the 3D pulsed ESPI technique have been identified and carried out in the field of automotive NVH applications, aerospace and railway technique.

Paper Details

Date Published: 21 September 1999
PDF: 7 pages
Proc. SPIE 3824, Optical Measurement Systems for Industrial Inspection, (21 September 1999); doi: 10.1117/12.364249
Show Author Affiliations
Zhiguo Wang, Dr. Ettemeyer GmbH & Co. (Germany)
Thomas Walz, Dr. Ettemeyer GmbH & Co. (Germany)
H. R. Schubach, Dr. Ettemeyer GmbH & Co. (Germany)
Andreas Ettemeyer, Dr. Ettemeyer GmbH & Co. (Germany)

Published in SPIE Proceedings Vol. 3824:
Optical Measurement Systems for Industrial Inspection
Malgorzata Kujawinska; Wolfgang Osten, Editor(s)

© SPIE. Terms of Use
Back to Top