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Proceedings Paper

NIST programs for calibrations in the far ultraviolet spectral region
Author(s): Robert E. Vest; L. Randall Canfield; Mitchell L. Furst; Rossie M. Graves; A. D. Hamilton; Lanny R. Hughey; Thomas B. Lucatorto; Robert P. Madden
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Paper Abstract

The National Institute of Standards and Technology (NIST) serves the growing ultraviolet user community by providing calibration services throughout the spectral range from 2 nm to 400 nm. In this paper we describe the far ultraviolet transfer standard detector program, the NASA-supported Spectrometer Calibration Beamline at the Synchrotron Ultraviolet Radiation Facility, SURF III, and the recent upgrade of the SURF electron storage ring. Several types of transfer standard detectors are issued by NIST in the spectral range from 5 nm to 254 nm; Al2O3 windowless photoemissive devices, CsTe photoemissive devices with integrated MgF2 windows, and radiation-hardened, semiconductive Si photodiodes. The Spectrometer Calibration Beamline makes use of the cathode, undispersed synchrotron radiation from SURF III as a standard of spectral irradiance from 2 nm to 400 nm. The upgrade of SURF has greatly improved the accuracy of calibrations based on SURF, as well as extending the useful spectral range to shorter wavelengths. Taken together, the transfer standard detector program and the calibration beamline at SURF III offer a unique calibration resource for scientists and engineers working in the far ultraviolet spectral region.

Paper Details

Date Published: 28 September 1999
PDF: 12 pages
Proc. SPIE 3818, Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II, (28 September 1999); doi: 10.1117/12.364157
Show Author Affiliations
Robert E. Vest, National Institute of Standards and Technology (United States)
L. Randall Canfield, National Institute of Standards and Technology (United States)
Mitchell L. Furst, National Institute of Standards and Technology (United States)
Rossie M. Graves, National Institute of Standards and Technology (United States)
A. D. Hamilton, National Institute of Standards and Technology (United States)
Lanny R. Hughey, National Institute of Standards and Technology (United States)
Thomas B. Lucatorto, National Institute of Standards and Technology (United States)
Robert P. Madden, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 3818:
Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II
George R. Carruthers; Kenneth F. Dymond, Editor(s)

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