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Proceedings Paper

Reflectance standards at ultraviolet wavelengths
Author(s): Patricia Yvonne Barnes; Maria E. Nadal; Edward A. Early
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Paper Abstract

Polytetrafluoroethylene (PTFE) is widely used in remote sensing applications requiring a diffuse reflectance standard for detector calibration. The bi-directional and directional-hemispherical reflectance properties of both pressed and sintered PTFE were measured at ultraviolet wavelengths to provide information for their use as standards in this spectral range. The reflectance decreases with decreasing wavelength for both geometries, and the ratio between the reflectances for these geometries remains constant for wavelengths from 300 nm to 400 nm.

Paper Details

Date Published: 28 September 1999
PDF: 6 pages
Proc. SPIE 3818, Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II, (28 September 1999); doi: 10.1117/12.364154
Show Author Affiliations
Patricia Yvonne Barnes, National Institute of Standards and Technology (United States)
Maria E. Nadal, National Institute of Standards and Technology (United States)
Edward A. Early, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 3818:
Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II
George R. Carruthers; Kenneth F. Dymond, Editor(s)

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