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Proceedings Paper

Modern wavelength standards in the ultraviolet and vacuum ultraviolet
Author(s): Joseph Reader; Craig J. Sansonetti
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Paper Abstract

In recent work at the National Institute of Standards and Technology the Atomic Spectroscopy Group has characterized several sources of wavelength standards useful for remote sensing applications. At low resolution, mercury pencil-type lamps are convenient for use either in the laboratory or the field. We recommend wavelengths for this lamp with an uncertainty of +/- 0.001 angstroms in the region 2535 angstroms to 5790 angstroms. We also provide relative irradiances for the most prominent Hg lines, data that can be used to determine instrumental response. For high- resolution applications, we have measured wavelengths and relative intensities emitted by a commercial Pt/Ne hollow cathode lamp. Wavelengths for 5600 lines from 1130 angstroms to 4330 angstroms, some with uncertainties as small as +/- 0.0004 angstroms, are available in a comprehensive atlas of this lamp. Excellent calibration lines can also be obtained from demountable hollow cathode lamps. We review wavelength standards in Fe I and II, Th I and II, Ar II, and Cu II that can be excited in such lamps. Cu II provides wavelengths with uncertainties of less than +/- 0.0004 angstroms from 670 angstroms through the entire ultraviolet region. For calibrations at shorter wavelengths, we have developed accurate standards that can be excited in a sliding-spark discharge with yttrium electrodes.

Paper Details

Date Published: 28 September 1999
PDF: 7 pages
Proc. SPIE 3818, Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II, (28 September 1999); doi: 10.1117/12.364143
Show Author Affiliations
Joseph Reader, National Institute of Standards and Technology (United States)
Craig J. Sansonetti, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 3818:
Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II
George R. Carruthers; Kenneth F. Dymond, Editor(s)

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