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Proceedings Paper

Numerical comparison between shear force, constant height, and constant intensity images in scanning near-field optical microscopy
Author(s): Mufei Xiao; Xin Chen
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Paper Abstract

We present a numerical comparison between shear-force, constant-height and constant-intensity images in scanning near-field optical microscopy. We demonstrate the general difference between the three images. Two type of incident light are tested of polarization in perpendicular and parallel direction with respect to the mean plane of the surface. Merits and demerits of the three images are discussed.

Paper Details

Date Published: 22 September 1999
PDF: 8 pages
Proc. SPIE 3791, Near-Field Optics: Physics, Devices, and Information Processing, (22 September 1999); doi: 10.1117/12.363854
Show Author Affiliations
Mufei Xiao, Univ. Nacional Autonoma de Mexico (United States)
Xin Chen, Univ. of Manchester Institute of Science and Technology (United Kingdom)


Published in SPIE Proceedings Vol. 3791:
Near-Field Optics: Physics, Devices, and Information Processing
Suganda Jutamulia; Motoichi Ohtsu; Toshimitsu Asakura, Editor(s)

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