Share Email Print
cover

Proceedings Paper

Error analysis of a multiaxis nanometric optical metrology system for microdynamic experiments
Author(s): Koroush Iranpour-Tehrani; Lee D. Peterson; Jason D. Hinkle
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The objective of ground based microdynamic testing of deployable space structures is to determine and develop a better understanding of the submicron dynamics that exists between moving contact surfaces. Such measurements often use laser and video metric metrology systems. These measurement however, are corrupted by random environmental perturbations of the metrology optics. This paper represents a statistical method for obtaining the margin of perturbations on the optics. The optics used are those for one of the preliminary flight configurations for the Micron Accuracy Deployment Experiments Space Station laboratory. The approach and method used to determine the extent of the effect of the random environmental perturbations on the measurements is explained and results are obtained. The results indicate that for 100 nanometer total allowable error. The optics need to be stable to within 85 nm of displacement and 10 mArcSec of rotation.

Paper Details

Date Published: 28 September 1999
PDF: 7 pages
Proc. SPIE 3786, Optomechanical Engineering and Vibration Control, (28 September 1999); doi: 10.1117/12.363819
Show Author Affiliations
Koroush Iranpour-Tehrani, Univ. of Colorado/Boulder (United States)
Lee D. Peterson, Univ. of Colorado/Boulder (United States)
Jason D. Hinkle, Univ. of Colorado/Boulder (United States)


Published in SPIE Proceedings Vol. 3786:
Optomechanical Engineering and Vibration Control
Eddy A. Derby; Eddy A. Derby; Colin G. Gordon; Colin G. Gordon; Daniel Vukobratovich; Carl H. Zweben; Daniel Vukobratovich; Paul R. Yoder; Carl H. Zweben, Editor(s)

© SPIE. Terms of Use
Back to Top