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Proceedings Paper

Polarization models for Monte Carlo ray tracing
Author(s): Edward R. Freniere; G. Groot Gregory; Richard A. Hassler
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Paper Abstract

In many optical systems, the polarization state of light is of critical importance and must be considered during their design. In other systems, the polarization state is used and manipulated as an integral part of the design. Three methods exist for modeling the polarization state of light: the Mueller calculus; the Jones calculus; and the polarization ray tracing calculus. The relative advances of these methods for simulating the polarization behavior of real devices using Monte Carlo ray tracing software is discussed, including simulation of the polarization properties of scattered light.

Paper Details

Date Published: 27 September 1999
PDF: 3 pages
Proc. SPIE 3780, Optical Design and Analysis Software, (27 September 1999); doi: 10.1117/12.363772
Show Author Affiliations
Edward R. Freniere, Lambda Research Corp. (United States)
G. Groot Gregory, Lambda Research Corp. (United States)
Richard A. Hassler, Lambda Research Corp. (United States)


Published in SPIE Proceedings Vol. 3780:
Optical Design and Analysis Software
Richard C. Juergens, Editor(s)

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