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Proceedings Paper

New method for analysis of planar optical waveguide with arbitrary distribution of dielectric constant profile
Author(s): Nikolai D. Espinosa Ortiz; Jesus Vila; Manuel Cuesta
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Paper Abstract

A new method is proposed for the analysis of singlemodes and multimodes planar gradient waveguides, with arbitrary distribution of the constant dielectric (epsilon) (y). The method designated (alpha) k permits the calculation of the propagation constants, critical frequencies and the TE and TM modes. The method allows one to determine the distribution of (epsilon) (y) from experimental model or from a theoretical model. In this work two theoretical models of the distribution of (epsilon) (y), that permit to simulate and analyze the assorted cases of planar optical waveguides are proposed. The (alpha) k method, can be used to draw the refractive index profile, based upon the values of the propagation constants obtained experimentally.

Paper Details

Date Published: 17 September 1999
PDF: 12 pages
Proc. SPIE 3778, Gradient Index, Miniature, and Diffractive Optical Systems, (17 September 1999); doi: 10.1117/12.363748
Show Author Affiliations
Nikolai D. Espinosa Ortiz, Escuela Politecnica del Ejercito (Ecuador)
Jesus Vila, Univ. del Pais Vasco (Ecuador)
Manuel Cuesta, Univ. del Pais Vasco (Ecuador)

Published in SPIE Proceedings Vol. 3778:
Gradient Index, Miniature, and Diffractive Optical Systems
Alan D. Kathman, Editor(s)

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