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Proceedings Paper

Recent observations with phase-contrast x-ray computed tomography
Author(s): Atsushi Momose; Tohoru Takeda; Yuji Itai; Jinhong Tu; Keiichi Hirano
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Paper Abstract

Recent development in phase-contrast X-ray computed tomography using an X-ray interferometer is reported. To observe larger samples than is possible with our previous X-ray interferometer, a large monolithic X-ray interferometer and a separated-type X-ray interferometer were studied. At the present time, 2.5 cm X 1.5 cm interference patterns have been generated with the X-ray interferometers using synchrotron X-rays. The large monolithic X-ray interferometer has produced interference fringes with 80% visibility, and has been used to measure various tissues. To produce images with higher spatial resolution, we fabricated another X-ray interferometer whose wafer was partially thinned by chemical etching. A preliminary test suggested that the spatial resolution has been improved.

Paper Details

Date Published: 22 September 1999
PDF: 8 pages
Proc. SPIE 3772, Developments in X-Ray Tomography II, (22 September 1999); doi: 10.1117/12.363720
Show Author Affiliations
Atsushi Momose, Hitachi, Ltd. (Japan)
Tohoru Takeda, Univ. of Tsukuba (Japan)
Yuji Itai, Univ. of Tsukuba (Japan)
Jinhong Tu, Hitachi, Ltd. (Japan)
Keiichi Hirano, High Energy Accelerator Research Organization (Japan)

Published in SPIE Proceedings Vol. 3772:
Developments in X-Ray Tomography II
Ulrich Bonse, Editor(s)

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