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Proceedings Paper

Process monitoring and control with CHEMIN, a miniaturized CCD-based instrument for simultaneous XRD/XRF analysis
Author(s): David T. Vaniman; D. Bish; G. Guthrie; S. Chipera; David E. Blake; S. Andy Collins; S. T. Elliott; P. Sarrazin
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Paper Abstract

There is a large variety of mining and manufacturing operations where process monitoring and control can benefit from on-site analysis of both chemical and mineralogic constituents. CHEMIN is a CCD-based instrument capable of both X-ray fluorescence (XRF; chemical) and X-ray diffraction (XRD; mineralogic) analysis. Monitoring and control with an instrument like CHEMIN can be applied to feedstocks, intermediate materials, and final products to optimize production. Examples include control of cement feedstock, of ore for smelting, and of minerals that pose inhalation hazards in the workplace. The combined XRD/XRF capability of CHEMIN can be used wherever a desired commodity is associated with unwanted constituents that may be similar in chemistry or structure but not both (e.g., Ca in both gypsum and feldspar, where only the gypsum is desired to make wallboard). In the mining industry, CHEMIN can determine mineral abundances on the spot and enable more economical mining by providing the means to assay when is being mined, quickly and frequently, at minimal cost. In manufacturing, CHEMIN could be used to spot-check the chemical composition and crystalline makeup of a product at any stage of production. Analysis by CHEMIN can be used as feedback in manufacturing processes where rates of heating, process temperature, mixture of feedstocks, and other variables must be adjusted in real time to correct structure and/or chemistry of the product (e.g., prevention of periclase and alkali sulfate coproduction in cement manufacture).

Paper Details

Date Published: 1 October 1999
PDF: 9 pages
Proc. SPIE 3769, Penetrating Radiation Systems and Applications, (1 October 1999); doi: 10.1117/12.363687
Show Author Affiliations
David T. Vaniman, Los Alamos National Lab. (United States)
D. Bish, Los Alamos National Lab. (United States)
G. Guthrie, Los Alamos National Lab. (United States)
S. Chipera, Los Alamos National Lab. (United States)
David E. Blake, NASA Ames Research Ctr. (United States)
S. Andy Collins, Jet Propulsion Lab. (United States)
S. T. Elliott, Jet Propulsion Lab. (United States)
P. Sarrazin, Etablissement National d'Enseignement Superieur Agronomique de Dijon (France)


Published in SPIE Proceedings Vol. 3769:
Penetrating Radiation Systems and Applications
F. Patrick Doty, Editor(s)

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